Prognostics and Health Management
Publications
Journal
A Similarity Based Prognostics Approach for Real Time Health Management of Elect…
Microelectronics Reliability, IF: 1.236, 70.38%
Lee, C., Kwon, D, 2018, 83, 77-83
Early Degradation Detection of the Insulation Resistance of MLCCs by the Pattern…
Nanoscience and Nanotechnology Letters, IF: 2.917, 26.03%
Baek, S., Kwon, D.*, and Kim, D., 2018, 10, 1-5
Lifetime Prediction of Optocouplers in Digital Input and Output Modules based on…
Smart Structures and Systems, IF: 2.231, 25.00%
Shin, I., and Kwon, D., 2018, 22(2), 167-174
Warpage Analysis during Fan-Out Wafer Level Packaging Process using Finite Eleme…
Journal of Microelectronics and Packaging Society,
Kim, G., and Kwon, D., 2018, 25(1), 41-45.
Defect State and Severity Analysis Using the Discretized State Vectors
Journal of Mechanical Science and Technology, IF: 1.194, 66.41%
Baek, S., Baek, W., Kwon, D., and Kim, D., 2018, 32(6), 2441-2451
Early Identification of Emerging Technologies: A Machine Learning Approach Using…
Technological Forecasting and Social Change, IF: 3.129, 12.28%
Lee, C.*, Kwon, O., Kim, M., and Kwon, D., 2018, 128, 291-303
Effect of Humidity Changes on Dimensional Stability of 3D Printed Parts
International Journal of Precision Engineering and Manufacturing, IF: 1.661, 52.34%
Kwon, D., Park, E., Ha, S., and Kim, N, 2017, 18(9), 1275-1280
Reliability Assessment of Low-Power Processor Packages in Supercomputing Systems
Shin, I., and Kwon, D., 2017, 9(8), 1241-1245
Industry 4.0: A Special Section in IEEE Access
IEEE Access, IF: 3.557, 16.22%
Su, S.*, Rudas, I., Zurada, J., Er, M., Chou, J., and Kwon, D., 2017, 5, 12257-12261
Reliability Assessment and Prediction of Solder Joints in High Temperature Heate…
Park, E., Kwon, D.*, Sa, Y., 2017, 24(2), 23-27
A Digital Technique for Diagnosing Interconnect Degradation by Using Digital Sig…
Microelectronics Journal, IF: 1.322, 67.31%
Lee, J., and Kwon, D., 2017, 60, 87-93
IoT-Based Prognostics and Systems Health Management for Industrial Applications
Kwon, D.*, Hodkiewicz, M., Fan, J., Shibutani, T., and Pecht, M, 2016, 4, 3659-3670
A Model-based Prognostic Approach to Predict Remaining Useful Life of Interconne…
Kwon, D.* and Yoon, J, 2016, 30(10), 4447-4452
Detection of MLCC Failure Precursors based on Symbolic Time Series Analysis
Park, J., and Kwon, D., 2016, 8(1), 75-80
Reliability Assessment of Low-Power Processor Packages for Supercomputers
Park, J., and Kwon, D., 2016, 23(2), 37-42
