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A Model-based Prognostic Approach to Predict Remaining Useful Life of Interconnects using Impedance Analysis

Author: Kwon, D.* and Yoon, J

Year: 2016

Journal: Journal of Mechanical Science and Technology

Vol: 30(10)

Page: 4447-4452

IF: IF: 1.194, 66.41%

Link: https://link.springer.com/article/10.1007/s12206-016-0910-2 460회 연결

Kwon, D.* and Yoon, J. (2016) “A Model-based Prognostic Approach to Predict Remaining Useful Life of Interconnects using Impedance Analysis,” Journal of Mechanical Science and Technology, vol. 30(10), pp. 4447-4452. (IF: 1.194, 66.41%)