A Digital Technique for Diagnosing Interconnect Degradation by Using Digital Signal Characteristics > Journal

A Digital Technique for Diagnosing Interconnect Degradation by Using Digital Signal Characteristics

Author: Lee, J., and Kwon, D.

Year: 2017

Journal: Microelectronics Journal

Vol: 60

Page: 87-93

IF: IF: 1.322, 67.31%

Link: https://www.sciencedirect.com/science/article/abs/pii/S002626921630317… 581회 연결

Lee, J., and Kwon, D.* (2017) “A Digital Technique for Diagnosing Interconnect Degradation by Using Digital Signal Characteristics,” Microelectronics Journal, vol. 60, pp. 87-93. (IF: 1.322, 67.31%)