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A Similarity Based Prognostics Approach for Real Time Health Management of Electronics using Impedance Analysis and SVM Regression

Author: Lee, C., Kwon, D

Year: 2018

Journal: Microelectronics Reliability

Vol: 83

Page: 77-83

IF: IF: 1.236, 70.38%

Link: https://www.sciencedirect.com/science/article/abs/pii/S002627141830045… 1476회 연결

Lee, C., Kwon, D.*, (2018) “A Similarity Based Prognostics Approach for Real Time Health Management of Electronics using Impedance Analysis and SVM Regression,” Microelectronics Reliability, vol. 83, pp. 77-83. (IF: 1.236, 70.38%)