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Development of a Non-invasive On-chip Interconnect Health Sensing Method Based on Bit Error Rates

Author: Shin, I., Koo, K., Kwon, D.

Year: 2018

Journal: Sensors

Vol: 18(10)

Page: 1-13

IF: IF: 2.475, 26.23%

Link: https://www.mdpi.com/1424-8220/18/10/3234/htm 1497회 연결

Shin, I., Koo, K., Kwon, D.*, (2018) “Development of a Non-invasive On-chip Interconnect Health Sensing Method Based on Bit Error Rates,” Sensors, vol. 18(10), pp. 1-13. (IF: 2.475, 26.23%)