Current Monitoring-based Diagnosis of Drive Belt Degradation in Wafer-handling Robots > Journal

Current Monitoring-based Diagnosis of Drive Belt Degradation in Wafer-handling Robots

Author: Goo, H., Lee, G., Kwon D.

Year: 2024

Journal: International Journal of Precision Engineering and Manufacturing

Vol: 26(4)

Page: 895-903

IF: IF 2.552, 48.5%

Link: https://doi.org/10.1007/s12541-024-01159-5 422회 연결

Goo, H., Lee, G., & Kwon, D. (2025). Current Monitoring-based Diagnosis of Drive Belt Degradation in Wafer-handling Robots. International Journal of Precision Engineering and Manufacturing, 26(4), 895-903. (IF 2.552, 48.5%)