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Optimized Reliability Test Design to Reduce Uncertainties in Reliability Assessment

Author: Kwon, D.* and Lucero, A.

Year: 2012

Journal: Electronic Components and Technology Conference, San Diego, CA.

Link: https://ieeexplore.ieee.org/abstract/document/6249070 183회 연결

Kwon, D.* and Lucero, A. (2012) “Optimized Reliability Test Design to Reduce Uncertainties in Reliability Assessment,” IEEE Electronic Components and Technology Conference, San Diego, CA.