Prognostics and Health Management
Publications
Conference
An Approach to Monitor Interconnect Degradation for Prognostics of Electronics Based on Digital Signal Characterization
- Year
- 2016
- Journal
- International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, Jiuzhaigou, China.
Lee, J., Kwon, D.* (2016) “An Approach to Monitor Interconnect Degradation for Prognostics of Electronics Based on Digital Signal Characterization,” International Conference on Quality, Reliability, Risk, Maintenance, and Safety Engineering, Jiuzhaigou, China.