Prognostics and Health Management

Publications

Conference

Use of Skin Effect for Detection of Interconnect Degradation
Author
Azarian, M. H.*, Kwon, D., and Pecht, M.
Year
2009
Journal
International Microelectronics and Packaging Society, San Jose, CA.

Azarian, M. H.*, Kwon, D., and Pecht, M. (2009) “Use of Skin Effect for Detection of Interconnect Degradation,” International Microelectronics and Packaging Society, San Jose, CA.