Prognostics and Health Management

Publications

Conference

Kwon, D., Azarian, M. H.*, and Pecht, M.
Author
Comparative Analysis of Interconnect Degradation using RF Impedance and Event Detectors
Year
2010
Journal
IPC APEX Expo, Las Vegas, NV.

Kwon, D., Azarian, M. H.*, and Pecht, M., (2010) “Comparative Analysis of Interconnect Degradation using RF Impedance and Event Detectors,” IPC APEX Expo, Las Vegas, NV.