Prognostics and Health Management

Member

Alumni

Total 7건 1 페이지
  • 이준수 (Mr. Junsu Lee)
    - 공학석사
    현재소속 : SK 하이닉스
    학위 논문 :
    A Novel Degradation Indicator based on Digital Signal for Sensitivity in Real-time Transmission Line Degradation Monitoring
    - Master of science
    Current position : SK hynix
    Thesis :

    A Novel Degradation Indicator based on Digital Signal for Sensitivity in Real-time Transmission Line Degradation Monitoring

  • 구희재 (Mr. Heejae Goo)
    - 공학석사
    현재소속 : SEMES
    학위 논문 :
    Failure-Mechanism-based Feature Extraction for Equipment Degradation State Diagnostics
    - Master of science
    Current position : SEMES
    Thesis :

    Failure-Mechanism-based Feature Extraction for Equipment Degradation State Diagnostics

  • 강문식 (Mr. Moonsik Kang)
    - 공학석사
    현재소속 : LIG Nex1
    학위 논문 :
    Failure Mechanism-based Reliability Assessment Framework for Lifetime Estimation: Case Study on an Automotive Component
    - Master of science
    Current position : LIG Nex1
    Thesis :

    Failure Mechanism-based Reliability

    Assessment Framework for Lifetime Estimation: Case Study on an Automotive Component

  • 김금택 (Mr. Geumtaek Kim)
    - 공학석사
    현재소속 : 삼성전자
    학위 논문 :
    Warpage Analysis during Fan-Out Wafer Level Packaging Process using Finite Element Analysis
    - Master of science
    Current position : Samsung Electronics
    Thesis :

    Warpage Analysis during Fan-Out Wafer Level Packaging Process using Finite Element Analysis Current position : Samsung Electronics

  • 구경민 (Dr. Kyungmin Koo)
    - 박사 후 연구원
    현재소속 : 한국섬유기계융합연구원
    학위 논문 :
    -
    - Post-doctoral Researcher
    Current position : KOTMI (KOrea Textile Machinery Research Institute)
    Thesis :

    -

  • 신인선 (Ms. Insun Shin)
    - 공학석사
    현재소속 : LG Innotek
    학위 논문 :
    Development of an On-chip Health Monitoring System for Solder Joints using Bit Error Rates
    - Master of science
    Current position : LG Innotek
    Thesis :

    Development of an On-chip Health Monitoring System for Solder Joints using Bit Error Rates

  • 윤정아 (Ms. Jeongah Yoon)
    - 공학석사
    현재소속 : LIG Nex1
    학위 논문 :
    An Approach to Assess Solder Interconnect Degradation Using Digital Signal
    - Master of Science
    Current position : LIG Nex1
    Thesis :

    An  Approach  to  Assess  Solder  Interconnect Degradation Using Digital Signal

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