Prognostics and Health Management
Publications
Journal
Warpage Simulation during Fan-Out Wafer-Level Packaging Process with Uncertainty…
Journal of Nanoscience and Nanotechnology, IF: 1.134, 77.12%
Kim, G., and Kwon, D., 2021, 21(5), 2987-2991
Review on Quality Control Methods in Metal Additive Manufacturing
Applied Sciences, IF: 2.474, 34.6%
Lee, J., Park, H. J., Chai, S., Kim, G. R., Yong, H., Bae, S. J., & Kwon, D, 2021, 11(4), 1966
Degradation Analysis, Fault Diagnosis and Remaining Life Prediction of Integrate…
Korean Journal of Computational Design and Engineering,
Koh, H., Lee, J., Ra, Y., Kang, M., Yoo, Y., Kwon, D., and Lee, J., 2020, 25(2), 192-204
A drop-impact reliability assessment of mobile display modules using a statistic…
Journal of Mechanical Science and Technology, IF: 1.345, 74.3%
Kim, S., Kwon, D., and Bae, S. J., 2020, 34(10), 3945-3955
Data-driven Fault Diagnosis Based on Coal-fired Power Plant Operating Data
Choi, H., Kim, C., and Kwon, D., 2020, 34(10), 3931-3936
Dynamics of Bubble Behavior in Nucleate Boiling of R134a in an Enhanced Horizont…
IEEE Access, IF: 3.745, 22.1%
Koo, K., Kwon, D., 2019, 7, 182444-182450
Real-time Quality Monitoring and Control System Using an Integrated Cost Effecti…
Oh, Y., Busogi, M., Ransikarbum, K., Shin, D., Kwon, D., Kim, N., 2019, 33(12), 1-12
Reduction of Li-ion Battery Qualification Time Based on Prognostics and Health M…
IEEE Transactions on Industrial Electronics, IF: 7.515, 0.78%
Lee, J., Kwon, D.*, Pecht, M., 2019, 66(9), 7310-7315
Non-Destructive Wire Fault Diagnosis Using Resistance Spectroscopy Analysis
Park, E., Kim, N., Kim, S., Kwon, D., 2019, 33(8), 3649-3654
Accelerated Degradation Model for C-rate Loading of Lithium-ion Batteries
International Journal of Electrical Power and Energy Systems, IF: 3.745, 22.1%
Saxena, S.*, Kwon, D., Pecht, M., and Xing, Y., 2019, 107, 438-445
Adaptive SVM-based Real-time Quality Assessment for Primer-Sealer Dispensing Pro…
Reliability Engineering and System Safety, IF: 5.040, 7.6%
Oh, Y., Ransikarbum, K., Busogi, M., Kwon, D., and Kim, N., 2019, 184, 202-212
PHM-based Wiring System Damage Estimation for Near Zero Downtime in Manufacturin…
Lee, J., Kwon, D.*, Kim, N., and Lee, C., 2019, 184, 213-218
Effect of Material Property Uncertainty on Warpage during Fan Out Wafer-Level Pa…
Journal of Microelectronics and Packaging Society,
Kim, G., Kang, G., and Kwon, D., 2019, 26(1), 29-33
TDR-based Multiple Leak Detection System using an S-parameter Transmission Line …
International Journal of Prognostics and Health Management,
Woo, S., Kim, T., Lee, J., Oh, H., Youn, B. D., Kwon, D., 2018, 9, 1-13
Development of a Non-invasive On-chip Interconnect Health Sensing Method Based o…
Sensors, IF: 2.475, 26.23%
Shin, I., Koo, K., Kwon, D., 2018, 18(10), 1-13
