Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance > Journal

Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance

Author: Kwon, D., Azarian, M. H.*, and Pecht, M.

Year: 2009

Journal: IEEE Trans. on Device and Materials Reliability

Vol: 9(2)

Page: 296-304

IF: IF: 1.512, 60.00%

Link: https://ieeexplore.ieee.org/document/4909023 626회 연결

Kwon, D., Azarian, M. H.*, and Pecht, M. (2009) “Early Detection of Interconnect Degradation by Continuous Monitoring of RF Impedance,” IEEE Trans. on Device and Materials Reliability, vol. 9(2), pp. 296-304. (IF: 1.512, 60.00%)