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Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test

Author: Kwon, D., Azarian, M. H.*, and Pecht, M.

Year: 2010

Journal: International Journal of Perfomability Engineering

Vol: 6(5)

Page: 443-452

Link: https://www.ijpe-online.com/www.ijpe-online.com/EN/10.23940/ijpe.10.5.… 257회 연결

Kwon, D., Azarian, M. H.*, and Pecht, M. (2010) “Prognostics of Interconnect Degradation using RF Impedance Monitoring and Sequential Probability Ratio Test,” International Journal of Perfomability Engineering, vol. 6(5), pp. 443-452.