Non-Destructive Sensing of Interconnect Failure Mechanisms using Time Domain Reflectometry > Journal

Non-Destructive Sensing of Interconnect Failure Mechanisms using Time Domain Reflectometry

Author: Kwon, D., Azarian, M. H.*, and Pecht, M.

Year: 2011

Journal: IEEE Sensors Journal

Vol: 11(5)

Page: 1236-1241

IF: IF: 2.617, 22.95%

Link: https://ieeexplore.ieee.org/document/5604635 419회 연결

Kwon, D., Azarian, M. H.*, and Pecht, M. (2011) “Non-Destructive Sensing of Interconnect Failure Mechanisms using Time Domain Reflectometry,” IEEE Sensors Journal, vol. 11(5), pp. 1236-1241. (IF: 2.617, 22.95%)