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Reliability Risk Assessment and Standardization Strategy for Single-Phase Immersion-Cooled Data Center

Author: Lee, J., Kwon, D.

Year: 2026

Journal: IEEE Access

Vol: 14

Page: 36774-36787

IF: IF: 3.6, 35.2%

Link: https://ieeexplore.ieee.org/abstract/document/11421850 96회 연결

Lee, J., & Kwon, D. (2026). Reliability Risk Assessment and Standardization Strategy for Single-Phase Immersion-Cooled Data Center. IEEE Access, 14, 36774-36787.