Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear Modeling > Journal

Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear Modeling

Author: Kwon, D.*, Azarian, M. H., and Pecht, M

Year: 2013

Journal: Journal of Microelectronics and Packaging Society

Vol: 20(3)

Page: 1-4

Link: http://www.koreascience.or.kr/article/JAKO201309972440046.page 225회 연결

Kwon, D.*, Azarian, M. H., and Pecht, M. (2013) “Failure Prediction of Multilayer Ceramic Capacitors (MLCCs) under Temperature-Humidity-Bias Testing Conditions Using Non-Linear Modeling,” Journal of Microelectronics and Packaging Society, vol. 20(3), pp. 1-4.