Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages > Journal

Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages

Author: Kwon, D.*, and Shin, I.

Year: 2015

Journal: Journal of Microelectronics and Packaging Society

Vol: 22(2)

Page: 1-4

Link: http://www.koreascience.or.kr/article/JAKO201523047607164.page 296회 연결

Kwon, D.*, and Shin, I. (2015) “Optimal Interval Censoring Design for Reliability Prediction of Electronic Packages,” Journal of Microelectronics and Packaging Society, vol. 22(2), pp. 1-4.