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Reliability Assessment of Low-Power Processor Packages for Supercomputers

Author: Park, J., and Kwon, D.

Year: 2016

Journal: Journal of Microelectronics and Packaging Society

Vol: 23(2)

Page: 37-42

Link: http://koreascience.or.kr/article/JAKO201724854218103.page 216회 연결

Park, J., and Kwon, D.* (2016) “Reliability Assessment of Low-Power Processor Packages for Supercomputers,” Journal of Microelectronics and Packaging Society, vol. 23(2), pp. 37-42.